When receiving a temperature change, a strain gage bonded to a measuring object generates an apparent strain due to a difference in linear expansion coefficient between the measuring object and the resistive element of the strain gage, and a thermally induced resistance change of the gage element. The SELCOM gage has a resistance temperature coefficient of the resistive element adjusted to match with the measuring object, thereby minimizing the apparent strain. Kyowa's SELCOM gages have been adjusted so that, when they are bonded to suitable measured materials, the average value of the apparent strain in the self-temperature-compensation range is within ±1.8 μm/m per °C* (representative value). As shown in Fig. 7, the thermally-induced apparent strain of KFGS gages is within ±1 μm/m per °C* in a temperature range of 20 to 40°C in which they are most frequently used. For the principle of SELCOM gages, see page 9-4. For the models and suitable measured materials, see page 1-6. * Representative value. For details, see the "Thermal Output" data attached with the products.